SNU College of Engineering (Dean Char, Kookheon) announced on the 9^th that the research team led by Professor Byoungho Lee of the Department of Electrical and Computer Engineering has developed a high-resolution 3D holographic microscopy.
 
General microscopy only captures the intensity of light. However, according to wave optics, both elements, amplitude and phase, must be provided to unveil the light’s wavefront. A holographic microscopy provides the two variables to allow a three-dimensional reconstruction of specimen profile; however, multiple scanning of the same specimen is required for high-resolution result.
 
Professor Lee’s team tackles this limitation by introducing an imaging modality that involves multiplexing. By processing the obtained clip via computer, the team develops its new imaging system known as “Single-Shot Fourier Ptychographic Microscopy,” which can retrieve a high-resolution phase profile without scanning.
 
This newly developed microscopy obtains a holographic clip of 3 micrometer (μm) resolution with a single measurement, which is a huge improvement from the conventional holographic microscopy that requires 3-4 takes for an image of equal resolution.
 
Professor Lee states, “This research is a leap forward to the commoditization of holographic microscopy. We anticipate it to become a core technology in lifting 3D profiles of fingerprints without damaging their fine details, monitoring the manufacturing processes of products, etc. We look forward to its stretch into various biomedical fields.”
 
The research paper has been posted on Optica, a scientific journal published by The Optical Society, on August 7^th. The findings have received great acknowledgment to be selected as a subject for the journal’s public relations article.
 
Meanwhile, this research was supported by Projects for Research and Development of Police Science and Technology under Center for Research and Development of Police science and Technology and Korean National Police Agency.

 
 
[Referential Links]
- Title: Single-shot phase retrieval via Fourier ptychographic microscopy, Optica, vol. 5, no. 8, pp. 976-983, august 2018.
- Link: https://doi.org/10.1364/OPTICA.5.000976